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ISO16750-2,2010

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ISO16750-2,2010

INTERNATIONAL

STANDARD

ISO

16750-2

Third edition

2010-03-15

Road vehicles — Environmental

conditions and testing for electrical

and electronic equipment —

Part 2:

Electrical loads

Véhicules routiers — Spécifications d'environnement et essais

de l'équipement électrique et électronique —

Partie 2: Contraintes électriques

Reference number

ISO 16750-2:2010(E)

ISO 2010

ISO 16750-2:2010(E)

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Published in Switzerland

ISO 16750-2:2010(E)

Contents

Page

.iv

4.1

4.2

4.3

4.4

4.5

4.6

4.7

4.8

4.9

4.10

4.11

4.12

4.13

Terms 1

Tests 1

Direct current 2

Superimposed 4

Slow decrease and increase of 6

Discontinuities in 6

Ground reference and 15

Open .15

Short 16

.17

.18

iii

ISO 16750-2:2010(E)

Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies

(ISO member bodies). The work of preparing International Standards is normally carried out through ISO

technical committees. Each member body interested in a subject for which a technical committee has been

established has the right to be represented on that committee. International organizations, governmental and

non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the

International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.

International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.

The main task of technical committees is to prepare International Standards. Draft International Standards

adopted by the technical committees are circulated to the member bodies for voting. Publication as an

International Standard requires approval by at least 75 % of the member bodies casting a vote.

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

rights. ISO shall not be held responsible for identifying any or all such patent rights.

ISO 16750-2 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3,

Electrical and electronic equipment.

This third edition cancels and replaces the second edition (ISO 16750-2:2006), which has been technically

revised.

ISO 16750 consists of the following parts, under the general title Road vehicles — Environmental conditions

and testing for electrical and electronic equipment:

⎯ Part 1: General

⎯ Part 2: Electrical loads

⎯ Part 3: Mechanical loads

⎯ Part 4: Climatic loads

⎯ Part 5: Chemical loads

INTERNATIONAL STANDARD

ISO 16750-2:2010(E)

Road vehicles — Environmental conditions and testing

for electrical and electronic equipment —

Part 2:

Electrical loads

1 Scope

This part of ISO 16750 applies to electric and electronic systems/components for road vehicles. This part of

ISO 16750 describes the potential environmental stresses and specifies tests and requirements

recommended for the specific mounting location on/in the road vehicle.

This part of ISO 16750 describes the electrical loads. Electromagnetic compatibility (EMC) is not covered by

this part of ISO 16750. Electrical loads are independent from the mounting location, but can vary due to the

electrical resistance in the vehicle wiring harness and connection system.

2 Normative references

The following referenced documents are indispensable for the application of this document. For dated

references, only the edition cited applies. For undated references, the latest edition of the referenced

document (including any amendments) applies.

ISO 8820 (all parts), Road vehicles — Fuse-links

ISO 16750-1, Road vehicles — Environmental conditions and testing for electrical and electronic

equipment — Part 1: General

ISO 16750-4, Road vehicles — Environmental conditions and testing for electrical and electronic

equipment — Part 4: Climatic loads

3 Terms and definitions

For the purposes of this document, the terms and definitions given in ISO 16750-1 apply.

4 Tests and requirements

4.1 General

If not otherwise specified, the following tolerances shall apply:

⎯ frequency and time: ±5 %;

⎯ voltages: ±0,2 V;

⎯ resistance: ±10 %.

ISO 16750-2:2010(E)

If not otherwise specified, measure all voltages at the relevant terminals of the device under test (DUT).

4.2 Direct current supply voltage

4.2.1 Purpose

The purpose of this test is to verify equipment functionality at minimum and maximum supply voltage.

4.2.2 Test method

Set the supply voltage as specified in Table 1 or Table 2 to all relevant inputs of the DUT. Operating modes

are specified in ISO 16750-1.

The voltages listed in Table 1 or Table 2 are relevant within the operating temperature range as specified in

ISO 16750-4, without time limits.

Table 1 — Supply voltage for system devices with 12 V nominal voltage

Minimum supply voltage

Maximum supply voltage

Code

Smin

Smax

V V

A 6 16

B 8 16

C 9 16

D 10,5 16

Table 2 — Supply voltage for system devices with 24 V nominal voltage

Minimum supply voltage Maximum supply voltage

Code

Smin

Smax

V V

E 10 32

F 16 32

G 22 32

H 18 32

4.2.3 Requirement

All DUT functions shall remain class A as defined in ISO 16750-1 when tested in the supply voltage ranges

given in Table 1 or Table 2 respectively.

ISO 16750-2:2010(E)

4.3 Overvoltage

4.3.1 Systems with 12 V nominal voltage

4.3.1.1 Test at a temperature of T

max

− 20 °C

4.3.1.1.1 Purpose

This test simulates the condition where the generator regulator fails, so that the output voltage of the

generator rises above normal values.

4.3.1.1.2 Test method

Heat the DUT in a hot air oven to a temperature that is 20 °C below the maximum operating temperature,

max

. Apply a voltage of 18 V for 60 min to all relevant inputs of the DUT.

4.3.1.1.3 Requirement

The functional status for the DUT shall be minimum class C as defined in ISO 16750-1. Functional status shall

be class A where more stringent requirements are necessary.

4.3.1.2 Test at room temperature

4.3.1.2.1 Purpose

This test simulates a jump start.

4.3.1.2.2 Test method

Ensure that the DUT has stabilized at room temperature. Apply a voltage of 24 V for (60 ± 6) s to all relevant

inputs of the DUT.

4.3.1.2.3 Requirement

The functional status shall be minimum class D as defined in ISO 16750-1. Functional status shall be class C

where more stringent requirements are necessary.

4.3.2 Systems with 24 V nominal voltage

4.3.2.1 Purpose

This test simulates the condition where the generator regulator fails, so that the output voltage of the

generator rises above normal values.

4.3.2.2 Test at a temperature of T

max

− 20 °C

Heat the DUT in a hot air oven to a temperature that is 20 °C below the maximum operating temperature,

max

. Apply a voltage of 36 V for 60 min to all relevant inputs of the DUT.

4.3.2.3 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1. Functional status shall be class A

where more stringent requirements are necessary.

ISO 16750-2:2010(E)

4.4 Superimposed alternating voltage

4.4.1 Purpose

This test simulates a residual alternating current on the direct current supply.

4.4.2 Test method

Connect the DUT as shown in Figure 1. Apply the following test simultaneously to all applicable inputs

(connections) of the DUT; the severity level (1, 2, 3 or 4) shall be chosen in accordance with the application:

⎯ maximum supply voltage, U

Smax

(see Figure 2):

⎯ 16 V for systems with nominal voltage, U

, of 12 V;

⎯ 32 V for systems with nominal voltage, U

, of 24 V;

⎯ a.c. voltage (sinusoidal):

⎯ severity 1: peak to peak voltage, U

, of 1 V, for U

= 12 V and U

= 24 V;

⎯ severity 2: peak to peak voltage, U

, of 4 V, for U

= 12 V and U

= 24 V;

⎯ severity 3: peak to peak voltage, U

, of 10 V, for U

= 24 V only;

⎯ severity 4: peak to peak voltage, U

, of 2 V, for U

= 12 V;

⎯ internal resistance of the power supply: 50 mΩ to 100 mΩ;

⎯ frequency range (see Figure 3): 50 Hz to 25 kHz;

⎯ type of frequency sweep (see Figure 3): triangular, logarithmic;

⎯ sweep duration (see Figure 3): 120 s;

⎯ number of sweeps: 5 (continuously).

Key

1 sweep generator

2 power supply unit capable of being modulated

3 DUT

4 positive

5 ground or return

Figure 1 — Test set-up to voltage on component power supply lines

ISO 16750-2:2010(E)

Key

t time

U test voltage

peak to peak voltage

Smax

maximum supply voltage

Figure 2 — Test voltage with superimposed voltage

Key

t time, in seconds

f frequency, logarithmic scale, in hertz

1 one cycle

Figure 3 — Frequency sweep

ISO 16750-2:2010(E)

4.4.3 Requirement

The functional status shall be class A as defined in ISO 16750-1.

4.5 Slow decrease and increase of supply voltage

4.5.1 Purpose

This test simulates a gradual discharge and recharge of the battery.

4.5.2 Test method

Apply the following test simultaneously to all applicable inputs (connections) of the DUT.

Decrease the supply voltage from the minimum supply voltage, U

Smin

, to 0 V, then increase it from 0 V to

Smin

, applying a change rate of (0,5 ± 0,1) V/min linear, or in equal steps of not more than 25 mV.

4.5.3 Requirement

The functional status inside the supply voltage range (see Table 1 or Table 2) shall be as specified in 4.2.3.

Outside that range, it shall be minimum class D as defined in ISO 16750-1. The functional status of class C

may be specified where more stringent requirements are necessary.

4.6 Discontinuities in supply voltage

4.6.1 Momentary drop in supply voltage

4.6.1.1 Purpose

This test simulates the effect when a conventional fuse element melts in another circuit.

4.6.1.2 Test method

Apply the test pulse (see Figures 4 and 5) simultaneously to all relevant inputs (connections) of the DUT. The

rise time and fall time shall be not more than 10 ms.

Key

t time, in seconds

U test voltage, in volts

Smin

minimum supply voltage

Figure 4 — Short voltage drop for systems with 12 V nominal voltage

ISO 16750-2:2010(E)

Key

t time, in seconds

U test voltage, in volts

Smin

minimum supply voltage

Figure 5 — Short voltage drop for systems with 24 V nominal voltage

4.6.1.3 Requirement

The functional status shall be minimum class B as defined in ISO 16750-1. Reset is permitted upon

agreement.

4.6.2 Reset behaviour at voltage drop

4.6.2.1 Purpose

This test verifies the reset behaviour of the DUT at different voltage drops. This test is applicable to equipment

with reset function, e.g. equipment containing microcontroller

(

s).

4.6.2.2 Test

Apply the test pulse simultaneously in Figure 6 to all relevant inputs (connections) and check the reset

behaviour of the DUT.

Decrease the supply voltage by 5 % from the minimum supply voltage, U

Smin

, to 0,95U

Smin

. Hold this voltage

for 5 s. Raise the voltage to U

Smin

. Hold U

Smin

for at least 10 s and perform a functional test. Then decrease

the voltage to 0,9U

Smin

. Continue with steps of 5 % of U

Smin

, as shown in Figure 6, until the lower value has

reached 0 V. Then raise the voltage to U

Smin

again.

ISO 16750-2:2010(E)

Key

t time

U test voltage measured as a percentage of U

Smin

minimum supply voltage

Figure 6 — Supply voltage profile for the reset test

4.6.2.3 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1.

4.6.3 Starting profile

4.6.3.1 Purpose

This test verifies the behaviour of a DUT during and after cranking.

4.6.3.2 Test method

Apply the starting profile ten times, as specified in Figure 7 and Table 3 or Table 4, simultaneously to all

relevant inputs (connections) of the DUT. A break of 1 s to 2 s between the starting cycles is recommended.

One or more profiles as described in Tables 3 and 4 shall be chosen in accordance with the application.

ISO 16750-2:2010(E)

Key

t time

U test voltage

falling slope

rising slope

, t

duration parameters (in accordance with Table 3)

supply voltage for generator in operation (see ISO 16750-1)

supply voltage

supply voltage at t

f = 2 Hz.

Figure 7 — Starting profile

ISO 16750-2:2010(E)

Table 3 — Starting profile values for systems with 12 V nominal voltage (U

)

Parameter

Voltage

Level

I II III IV

8 (−0,2) 4,5 (−0,2) 3 (−0,2) 6 (−0,2)

9,5 (−0,2) 6,5 (−0,2) 5 (−0,2) 6,5 (−0,2)

5 (± 0,5) 5 (± 0,5)

15 (± 1,5)

50 (± 5)

1 000 (± 100)

100 (± 10)

5 (± 0,5)

15 (± 1,5)

50 (± 5)

10 000 (± 1 000)

100 (± 10)

5 (± 0,5)

Duration

50 (± 5)

1 000 (± 100)

(± 4)

Minimum functional

status

15 (±1,5) 15 (± 1,5)

50 (± 5)

10 000 (± 1 000)

100 (± 10)

Smin

= 6 V; U

Smax

= 16 V (see Table 1, Code A).

Smin

= 8 V; U

Smax

= 16 V (see Table 1, Code B).

Smin

= 9 V; U

Smax

= 16 V (see Table 1, Code C).

Smin

= 10,5 V; U

Smax

= 16 V (see Table 1, Code D).

Table 4 — Values systems with 24 V nominal voltage (U

)

Parameter

Voltage

Level

I II III

10 (−0,2) 8 (−0,2) 6 (−0,2)

20 (−0,2) 15 (−0,2) 10 (−0,2)

10 (± 1)

50 (± 5)

1 000 (± 100)

100 (± 10)

10 (± 1)

50 (± 5)

1 000 (± 100)

40 (± 10)

10 (± 1)

Duration

50 (± 5)

1 000 (± 100)

(± 4)

Minimum functional

status

Smin

= 10 V; U

Smax

= 32 V (see Table 2, Code E).

Smin

= 16 V; U

Smax

= 32 V (see Table 2, Code F).

Smin

= 22 V; U

Smax

= 32 V (see Table 2, Code G).

Smin

= 18 V; U

Smax

= 32 V (see Table 2, Code H).

ISO 16750-2:2010(E)

4.6.3.3 Requirement

Functions of the DUT that are relevant to vehicle operation during cranking shall be class A, all other functions

of the DUT shall be in accordance with Table 3 or Table 4.

4.6.4 Load dump

4.6.4.1 Purpose

This test is a simulation of load dump transient occurring in the event of a discharged battery being

disconnected while the alternator is generating charging current with other loads remaining on the alternator

circuit at this moment.

4.6.4.2 Test method

4.6.4.2.1 Test A – without centralized load dump suppression

The pulse shape and parameters for an alternator without centralized load dump suppression are given in

Figure 8 and Table 5. For the test voltage, U

, see ISO 16750-1.

Key

t time

U test voltage

duration of pulse

supply voltage for generator in operation (see ISO 16750-1)

rising slope

supply voltage

Figure 8 — Test without centralized load dump suppression

ISO 16750-2:2010(E)

Table 5 — Pulse for test A in systems with 12 V and 24 V nominal voltage

Parameter

Type of system

Minimum test requirements

= 12 V U

= 24 V

79 u U

u 101 151 u U

u 202 V

Ω

0,5 u R

u 4 1 u R

u 8

10 pulses at intervals

of 1 min

40 u t

u 400 100 u t

u 350

(

−

)

(

−

)

If not otherwise agreed, use the higher voltage level with the higher value for internal resistance, or use the lower voltage level with

the lower value for internal resistance.

NOTE The internal resistance, R

, of the load dump test pulse generator can be obtained as follows:

10×

nom

act

0,8×

rated

×12000min

−

where

nom

is the specified voltage of the alternator;

rated

is the specified current at an alternator speed of 6 000 min

–1

, as given in ISO 8854;

act

is the actual alternator speed, in reciprocal minutes.

4.6.4.2.2 Test B – with centralized load dump suppression

The pulse shape and parameters for an alternator with centralized load dump suppression are given in

Figure 9 and Table 6. For the test voltage, U

, see ISO 16750-1.

ISO 16750-2:2010(E)

Key

t time

U test voltage

duration of pulse

rising slope

supply voltage for generator in operation (see ISO 16750-1)

supply voltage

* supply voltage with load dump surpression

Figure 9 — Test with centralized load dump suppression

Table 6 — Pulse for test B in systems with 12 V and 24 V nominal voltage

Parameter

Ω

Type of system

= 12 V

79 u U

u 101

= 24 V

151 u U

u 202 V

Minimum test requirements

35 65

5 pulses at intervals of 1 min

0,5 u R

u 4

40 u t

u 400

1 u R

u 8

100 u t

u 350

()

−5

()

−5

If not otherwise agreed, use the higher voltage level with the higher value for internal resistance, or use the lower voltage level with

the lower value for internal resistance.

ISO 16750-2:2010(E)

4.6.4.3 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1.

4.7 Reversed voltage

4.7.1 Purpose

This test checks the ability of a DUT to withstand against the connection of a reversed battery in case of using

an auxiliary starting device.

This test is not applicable to:

⎯ generators, and

⎯ terminals with clamping diodes without external reverse polarity protection device.

4.7.2 Test method

4.7.2.1 General

Connect and fuse the DUT as in the real vehicle, but without generator and battery. Choose the applicable

voltages from the following cases and apply them simultaneously to all relevant power terminals with reversed

polarity.

4.7.2.2 Case 1

If the DUT is used in a vehicle in which the alternator circuit is not fused and the rectifier diodes withstand a

reversed voltage for 60 s, for systems with 12 V nominal voltage with reversed polarity, apply a test voltage of

4 V simultaneously to all relevant inputs (terminals) of the DUT for a duration of (60 ± 6) s.

This test is not applicable for systems with 24 V nominal voltage.

4.7.2.3 Case 2

In all other cases, apply the test voltage, U

(see ISO 16750-1 and Table 7), with reversed polarity

simultaneously to all relevant inputs (terminals) of the DUT for a duration of (60 ± 6) s.

Table 7 — Test voltage

Nominal voltage

Test voltage

12 14

24 28

4.7.3 Requirement

After replacing all blown fuse links, the functional status shall be class A as defined in ISO 16750-1.

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ISO 16750-2:2010(E)

4.8 Ground reference and supply offset

4.8.1 Purpose

This test shall be agreed between customer and supplier.

This test serves to verify reliable operation of a component if two or more power supply paths exist. For

instance, a component may have a power ground and a signal ground that are outputs on different circuits.

4.8.2 Test method

All inputs and outputs shall be connected to representative loads or networks to simulate the in-vehicle

configuration. Apply U

to the DUT and confirm normal operation.

The ground/supply offset test applies to ground/supply lines. The offset shall be applied to each ground/supply

line and between each ground/supply line separately in sequence.

For all DUTs, the offset voltage shall be (1,0 ± 0,1) V.

a) Apply U

to the DUT.

b) Subject ground/supply line to the offset voltage relative to the DUT ground/supply line.

c) Perform a functional test under this condition.

d) Repeat step c) for each next ground/supply line combination.

Repeat the test with reverse offset voltage.

4.8.3 Requirement

With regard to the functional performance status class A for all functional groups, there shall be no

malfunction or latch up of the DUT.

4.9 Open circuit tests

4.9.1 Single line interruption

4.9.1.1 Purpose

This test simulates an open contact condition.

NOTE This is not a test for connectors.

4.9.1.2 Test method

Connect and operate the DUT as intended. Open one circuit of the DUT/system interface, then restore the

connection. Observe the device behaviour during and after the interruption.

Repeat for each circuit of the DUT/system interface.

⎯ Interruption time: (10 ± 1) s;

⎯ Open circuit resistance: W 10 MΩ.

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ISO 16750-2:2010(E)

4.9.1.3 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1.

4.9.2 Multiple line interruption

4.9.2.1 Purpose

The purpose of this test to ensure functional status as defined in the specification of the DUT when the DUT is

subjected to a rapid multiple line interruption.

NOTE This is not a test for connectors.

4.9.2.2 Test method

Disconnect the DUT, then restore the connection. Observe the device behaviour during and after the

interruption.

⎯ Interruption time: (10 ± 1) s;

⎯ Open circuit resistance: W 10 MΩ.

For multi-connector devices, each possible connection shall be tested.

4.9.2.3 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1.

4.10 Short circuit protection

4.10.1 Purpose

These tests simulate short circuits to the inputs and outputs of a device.

4.10.2 Signal circuits

4.10.2.1 Test method

Connect all relevant inputs and outputs of the DUT in sequence for a duration of (60 ± 6) s to U

Smax

(see Tables 1 and 2) and to ground. All other inputs and outputs remain open or as agreed upon.

Perform this test with:

⎯ connected supply voltage and ground terminals:

⎯ outputs active,

⎯ outputs inactive;

⎯ disconnected supply voltage terminals;

⎯ disconnected ground terminals.

All unused inputs remain open unless otherwise agreed between customer and supplier.

ISO 16750-2:2010(E)

4.10.2.2 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1.

4.10.3 Load circuits

4.10.3.1 Test method

Connect the DUT to the power supply. The load circuits shall be in operation. For test duration, the

specifications of the appropriate part of ISO 8820 (operating time rating) shall be used, considering the upper

tolerance plus 10 %. If protection other than fuses is used (e.g. electronic protection), the test duration shall be

agreed between manufacturer and user. This test is applicable only for systems/components with load circuits.

4.10.3.2 Requirements

All electronically protected outputs shall withstand the currents as ensured by the corresponding protection

and shall return to normal operation upon removal of the short circuit current (the functional status shall be

minimum class C as defined in ISO 16750-1).

All conventional fuse protected outputs shall withstand the currents as ensured by the corresponding

protection and shall return to normal operation upon replacement of the conventional fuse (the functional

status shall be minimum class D as defined in ISO 16750-1).

All unprotected outputs may be damaged by the test current (the functional status shall be class E as defined

in ISO 16750-1) provided that the materials in the DUT are compliant with the flammability requirements of

UL94-V0 (see Reference [7]).

4.11 Withstand voltage

4.11.1 Purpose

This test ensures the dielectric withstand voltage capability of circuits with galvanic isolation. This test is

required only for systems/components which contain inductive elements (e.g. relays, motors, coils) or are

connected to circuits with inductive load.

The deliberate overvoltage between the galvanically isolated current carrying parts of the DUT could have a

negative effect on insulation performance caused by the electrical field. This test stresses the insulation

system and checks the ability of the dielectric material to withstand a higher voltage caused by switching off

inductive loads.

4.11.2 Test method

Perform a damp heat cyclic test in accordance with ISO 16750-4.

The system/components shall remain at room temperature for 0,5 h after the damp heat cyclic test.

Apply a sinusoidal test voltage of 500 V rms (50 Hz to 60 Hz) to devices in systems with 12 V and 24 V

nominal voltage for a duration of 60 s, as follows, between:

⎯ terminals with galvanic isolation;

⎯ terminals and housing with electrically conductive surface with galvanic isolation;

⎯ terminals and an electrode wrapped around the housing (e.g. metal foil, sphere bath) in the case of

plastic housing.

ISO 16750-2:2010(E)

4.11.3 Requirement

The functional status shall be minimum class C as defined in ISO 16750-1. Neither dielectric breakdown nor

flash-over shall occur during the test.

4.12 Insulation resistance

4.12.1 Purpose

This test ensures a minimum value of ohmic resistance required to avoid current between galvanically isolated

circuits and conductive parts of the DUT.

The test gives an indication of the relative quality of the insulation system and material.

4.12.2 Test method

Perform a damp heat cyclic test in accordance with ISO 16750-4.

The system/components shall remain at room temperature for 0,5 h after the damp heat cyclic test.

Apply a test voltage of 500 to the DUT for 60 s, as follows, between:

⎯ terminals with galvanic isolation;

⎯ terminals and housing with electrically conductive surface with galvanic isolation;

⎯ terminals and an electrode wrapped around the housing (e.g. metal foil) in the case of plastic material

housing.

For particular applications, the test voltage can be reduced to 100 if agreed between customer and

supplier.

4.12.3 Requirement

The insulation resistance shall be greater than 10 MΩ.

4.13 Electromagnetic compatibility

EMC specifications are given in the Bibliography for information only (see References [1], [4], [5], [6], [8]

and [9]). Performance measurements based on these specifications are not included in the scope of

ISO 16750.

5 Documentation

For documentation, the designations according to ISO 16750-1 shall be used.

ISO 16750-2:2010(E)

Bibliography

[1] ISO 7637 (all parts), Road vehicles — Electrical disturbances from conduction and coupling

[2] ISO 8854, Road vehicles — Alternators with regulators — Test methods and general requirements

[3] ISO/TR 10305 (all parts), Road vehicles — Calibration of electromagnetic field strength measuring

devices

[4] ISO 10605, Road vehicles — Test methods for electrical disturbances from electrostatic discharge

[5] ISO 11451 (all parts), Road vehicles — Vehicle test methods for electrical disturbances from

narrowband radiated electromagnetic energy

[6] ISO 11452 (all parts), Road vehicles — Component test methods for electrical disturbances from

narrowband radiated electromagnetic energy

[7] UL94, Tests for Flammability of Plastic Materials for Parts in Devices and Appliances

[8] CISPR 12, Vehicles, boats, and internal combustion engine driven devices — Radio disturbance

characteristics — Limits and methods of measurement for the protection of receivers except those

installed in the vehicle/boat/device itself or in adjacent vehicles/boats/devices

[9] CISPR 25, Radio disturbance characteristics for the protection of receivers used on board vehicles,

boats, and devices — Limits and methods of measurement

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ISO 16750-2:2010(E)

ICS 43.040.10

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